S Parameter
S-Parameter Measurement
S-parameters are among the fundamental electrical parameters in circuit design and are commonly represented in 2-port or 4-port configurations. A 4-port S-parameter model consists of 16 individual terms, describing the relationship between incident and received energy within a network.
Among these, the most commonly used parameters are insertion loss and return loss.
S-parameter measurements are typically performed using a vector network analyzer (VNA) in combination with appropriate probes, connectors, or test fixtures.
Arcanum Advanced S-Parameter Measurement Capabilities
Arcanum Advanced has established comprehensive VNA measurement capabilities supporting the following:
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Single-ended and differential measurements, supporting .s2p and .s4p data formats
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In-board measurements, including under-BGA probing*
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Frequency range: up to 40 GHz
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Probe pitch range: 0.1 mm to 1.5 mm*
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Compatible with test fixtures for fixture-based measurements
Notes
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In-board measurements are performed using a probe station integrated with optical microscopy.
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The specified probe pitch refers to the probe pitch only and does not account for pad size. Please contact us for further evaluation.
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Measurements can be performed with or without dedicated test fixtures, depending on the application.
