依據歐盟施行的個人資料保護法，我們致力於保護您的個人資料並提供您對個人資料的掌握。
按一下「全部接受」，代表您允許我們置放 Cookie 來提升您在本網站上的使用體驗、協助我們分析網站效能和使用狀況，以及讓我們投放相關聯的行銷內容。您可以在下方管理 Cookie 設定。 按一下「確認」即代表您同意採用目前的設定。
TEST FIXTURE
Test fixture
Delta L 4.0 3.0
Delta L 4.0 3.0 量測
Characteristic Impedance
By using vector network analyzers (VNA) and real-time domain TDR instruments, S-parameter and impedance analysis can be performed on PCBs and discrete components. Combined with probe stations and probes of various pitch configurations, this setup enables accurate testing and analysis of PCBs or PCBAs with challenging geometries and access angles.
S Parameter
By utilizing vector network analyzers (VNA) and real-time domain TDR instruments, comprehensive S-parameter and impedance analysis can be performed on PCBs and electronic components. When combined with probe stations and probes with various pitch configurations, this setup enables accurate testing and analysis of PCBs or PCBAs with limited access or challenging probe angles.
Dk Df Analysis
By utilizing vector network analyzers (VNA) or LCR meters, and following IPC-TM-650 standards, a range of material characterization methods can be applied, including SPDR, SCR, and capacitance measurement techniques. Measurements are performed according to the specified frequency ranges and sample requirements, enabling accurate characterization and analysis of key material electrical properties.